Presentation will begin: Thursday, July 20, 2023 - 9:10 AM EDT
Presented by:
Christian Felsheim, Headwall Photonics Inc.The classification of raw and processed material and the detection of foreign material using real-time hyperspectral imaging in an industrial environment both greatly benefit from regular offline testing. Since material or classification standards can change over time, a rapid and intuitive way to scan and analyze material can help maintain or even improve performance in the factory.
Felsheim presents a tightly integrated hyperspectral-imaging system that allows interpretation of spectral images in minutes and allows speedy generation and deployment of classification models on the production and inspection lines.
About the presenter
Christian Felsheim joined Headwall as business development and OEM account manager for the EMEA region with a focus on expanding sales and solidifying customer relationships. Since then, he has been the driving force behind the successful introduction of the MV-series of advanced machine vision sensors and systems that are helping transform Headwall’s powerful technology into intuitive solutions that directly provide actionable data, as well as the incorporation of perClass Mira into the Headwall ecosystem of products.