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Advancing Raman Spectroscopy: The Importance for Metrological Infrastructure and Standardization

Presentation will begin: Wednesday, April 17, 2024 - 11:10 AM
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Advancing Raman Spectroscopy: The Importance for Metrological Infrastructure and Standardization

Presented by: Li-Lin Tay, Metrology Research Centre, National Research Council Canada

Raman spectroscopy has emerged as a pivotal analytical technique across diverse fields, from environmental monitoring to nanomaterials research. Despite its widespread application, the technique faces significant challenges in quantitative analysis due to the absence of a robust metrological foundation and standardized practices. Tay highlights the need for developing and implementing metrological infrastructure and normative standards in Raman spectroscopy.

Drawing on insights from current advances and challenges in Raman spectroscopy, such as obstacles in achieving traceable measurements, the limited availability of certified reference materials, and the dynamic development of Raman technologies, Tay highlights the pivotal role of metrology in enhancing measurement confidence, facilitating regulatory compliance, and fostering innovation. The presentation advocates for a concerted effort to establish traceable measurements and documentary standards, which are essential for advancing the impact of Raman spectroscopy in scientific and industrial applications.


About the presenter
Li-Lin TayLi-Lin Tay, Ph.D., is a principal research officer at the Metrology Research Centre, National Research Council Canada. Her team is responsible for the realization of the SI base unit of candela and many of its associated derived units. Tay holds a bachelor’s degree in physics and a doctorate in physical chemistry, both from the University of Toronto. Her email is Li-Lin.Tay@nrc-cnrc.gc.ca.




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