When people think of machine vision, industrial automation, quality inspection, part identification, and robotic guidance usually come to mind first. But another application that is just as critical, and often underestimated, is precision, in-line metrology.
Automated, noncontact measurement brings powerful advantages to manufacturing, but building a robust, reliable measurement application is not without its challenges. Join us for this technical session as we dig into the key issues that often get overlooked — and share proven best practices that can help set up your application for success.
What You'll Learn:
- Common (and often hidden) pitfalls in automated measurement system design.
- Best practices for achieving consistent, repeatable in-line results.
- How to design systems that deliver reliable measurement data on every part, every time.
This session is tailored for teams integrating machine vision directly into the manufacturing process to achieve measurement of every part produced, in real time, to boost production efficiency and quality.
About the presenter
David L. Dechow is an engineer, programmer, and technologist widely considered to be an expert and thought leader in the integration of machine vision, robotics, and other automation technologies.
