Photonics Spectra Optical Metrology Summit 2026

Registration for this event is now closed.

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About this event

The publishers of Photonics Spectra invite you to the Optical Metrology Summit, a virtual event taking place on April 22, 2026 that will explore emerging trends and strategies shaping the next generation of optical metrology and high-performance imaging systems.

Attendees will hear from industry experts at 4D Technology, Optikos, Brookhaven National Laboratory, TRIOPTICS, Optical Metrology Solutions, and ZYGO, with a focus on surface- and system-level metrology. Sessions will highlight centration and phase-shift analysis, noise reduction in 3D measurements, and detection of stray light artifacts in imaging systems.

In addition to providing deeper insights into optical metrology, this summit offers registrants the opportunity to ask presenters questions via live chat and to connect with others in the field.