Innovations in 3D Laser Profiling for Enhanced Metrology Applications

Explore the latest trends and developments in sensor technology, specifically focusing on laser triangulation sensors, and their impact on metrology applications. Kasper explains how advancements in resolution, speed, and sensor processing are pushing the limits of sensor to FPGA interfaces, leading to more efficient and cost-effective solutions. This presentation examines the benefits of customized sensor configurations based on standard sensor modules and the emergence of multi-feature sensors that enable advanced multi-channel evaluations while reducing system costs.

Moreover, Kasper highlights the growing importance of standardization in sensor features and data levels, which facilitate ease of use and faster time to market for application solutions. Finally, he delves into the trends in 3D processing technology, particularly the increasing adoption of multi-sensor setups for fast and precise metrology applications. These setups are replacing traditional tactile coordinate measuring machines (CMMs), enabling new inline applications. To fully harness the potential of these technologies, Kasper focuses on the need for standardized algorithms and characterized scanners in accordance with existing metrology norms.

About the presenter
André Kasper, Ph.D., co-founded Automation Technology GmbH with Michael Wandelt in 1998 after spending five years as a research assistant at Helmut Schmidt University. Kasper earned his doctorate from Helmut Schmidt after defending a thesis on scattered light sensors for surface characterization. His responsibilities included research and development, product management, support and applications, and manufacturing. Recently, he has focused on the combination of resolution and speed to develop faster 3D sensors.