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High Quality Measurements of Mid Spatial Frequencies in Optical Surfaces

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High Quality Measurements of Mid Spatial Frequencies in Optical Surfaces

Presented by: Robert Smythe, Äpre Instruments

Modern computer numerical control (CNC) polishing has revolutionized optical component manufacturing by enabling both more precise and wilder surface shapes to be deterministically manufactured. Subaperture or small tool polishing used by these machines now introduces higher frequency surface structures called mid-spatial frequencies (MSF), which need to be understood and controlled.

This presentation describes what MSF are, how they affect optical performance, methods to characterize and metrology tools to measure. The presentation will be beneficial to engineers, manufacturing technicians, and metrologists working in the field of optical manufacturing.


About the presenter
Robert SmytheRobert Smythe began his career grinding and polishing mirrors for telescopes. Then, after obtaining a degree in astrophysics, he worked at Tropel (Corning) for five years, where he designed advanced Fizeau and Twyman-Green interferometers for semiconductor optics and industrial applications. This was followed by over 20 years of service at Zygo Corp., where he designed, developed, and marketed interferometers. During this time, he led the development of MetroPro software, NewView profilers, and the Verifier Asphere Scanning Fizeau, among other products. After a five-year period of consulting to industry leaders in interferometric metrology, Smythe co-founded Äpre Instruments to use his experience to help advance the field of interferometers, with a focus on optical manufacturing.




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