Selecting the Right Metrology Tool when Weighing Factors Such as Part Access, Surface Quality and Geometry Limitations

Recent years have seen a growth of 3D optical metrology tools able to map objects, some big like buildings and others small like microbes. Making sense of what tool can do what task can be daunting to anyone not very familiar with the technology used and the limitations of each 3D method.

This presentation reviews the basic technical mechanisms of the many 3D optical metrology systems available and looks at both the strengths and limitations of each tool on a technical basis for applications ranging from meter sizes to microns.

Issues considered will include practical considerations of part access, surface quality, and geometry limitations with tradeoffs of these issues against practical measurement ranges and resolutions. The results provide a valuable starting point for picking the right 3D optical metrology tool for whatever task is required.

About the presenter
Kevin Harding has over 45 years of experience and the development and use of optical metrology methods. With over 80 short courses taught, 200 published papers, 88 US patents, and 2 books on the subject along with over 40 years working with industry, Harding provides a broad and unbiased perspective on the dos and don’ts of optical metrology. He is a fellow of SPIE and has been recognized for his work by AIA (A3), the Society of Manufacturing Engineers, and the Engineering Society of Detroit.