Enhancing Industrial Applications with Advanced SWIR and UV Imaging

Short-wave infrared (SWIR) and ultraviolet (UV) imaging are transforming industrial applications such as fruit inspection and sorting, packaging, IR microscopy, semiconductor inspection, and material sorting.

Teissié highlights the potential of SWIR imaging powered by new-age technology, enabling image capture across visible and invisible light spectrums with remarkable pixel sizes of 5µm and 3.45µm. Additionally, advancements in UV imaging are highlighted, focusing on the latest high-sensitivity sensors capable of detecting ultraviolet light in the 200 to 400nm range.Teissié uncovers how these technologies enhance precision, efficiency, and versatility in industrial environments.

About the presenter
Alexis Teissié is director of product management at LUCID Vision Labs, a leading manufacturer of innovative machine vision cameras and components that utilize the latest technologies to deliver exceptional value to customers. Teissie holds a master’s degree in computer vision from the University of Paris Sorbonne and has over 15 years of experience in the machine vision industry in a variety of engineering, product management, and marketing positions.