Lighting Considerations for Line-Scan Imaging

O’Neill covers the process of successfully implementing a line-scan system from start to finish. He talks about the advantages of line-scan systems and the hardware necessary to get the most out of your system. Starting with the part, O’Neill talks about best practices for line-scan systems, as well as how lighting can affect an application. Lastly, he goes over some of the nuances and common aspects to keep in mind when speccing out the lighting for machine vision.

About the presenter
Austin O’Neill is a senior member of Metaphase’s applications engineering team, with five years of experience in machine vision. He works with customers to test samples, coordinate evaluation units, and provide innovative solutions for some of today’s most demanding applications. He is an A3 Certified Vision Professional who has given webinars about SWIR lighting and line-scan applications, among other topics. Austin has previously worked at Edmund Optics and studied physics at Rowan University with a concentration in photonics.