Single Shot Scope Captures Micro-Defects With High Precision

Surface flaw detection can be enhanced with a scope that utilizes one-shot bidirectional reflectance distribution function (BRDF), which detects minute defects on flat surfaces in a single shot with high precision. OneshotBRDF technology has been developed at the Toshiba Research and Development Center. Such a scope enables the visualization of hard-to-detect micro-defects by distinguishing scattered light using multi-wavelength coaxial illumination.

This type of instrument is particularly well-suited for the inspection of glass materials, panel substrates, optical components, and precision parts. By converting specular reflection components into color information based on surface roughness, it enhances defect visibility by inducing color variations, even in non-defective areas. Equipped with a high-resolution USB3 camera, the device can be connected to a PC. Key features that potential users should take into consideration include the ability to detect micro-defects at tense of micrometers, inspection range and resolution. This technology is expected to enhance quality control in manufacturing and reduce inspection costs.

About the presenter
Yusuke Kawachi is a sales manager at Toshiba Teli Corporation, specializing in machine vision cameras. With 13 years of overseas sales experience, he has developed expertise in global business development and strategic market expansion. He is currently focused on cultivating new customer relationships and building strong partnerships in emerging markets across Southeast Asia and North America.