Future-Proofing Optical Metrology: Flexible Tools for Complex Measurement Challenges

As optical systems evolve and performance specifications tighten, metrology solutions must keep pace—offering not only precision but adaptability for future requirements. This presentation explores strategies for selecting a versatile suite of optical metrology tools that maximize long-term value and scalability. Considerations for various challenges include:

• Overcoming Vibration Challenges: Implementing vibration-immune technologies to address issues caused by mechanical vibration, moving parts, and turbulent airflow.
• Configuring for Complex Measurements: Supporting long cavity measurements, large concave optics, and in-situ testing in operating environments with vibration, thermal, or distance constraints.
• Investing in High-Fidelity ITF Solutions: Ensuring readiness for tightening specifications by adopting higher fidelity systems now.
• Leveraging Dual-Source Laser Options: Combining high-power lasers for low-return alignments with low-coherence configurations for broader application flexibility.
• Optimizing Flexible Mounting Architectures: Highlighting considerations for optimizing performance with mounting configurations, including vertical/horizontal orientations and kinematic mounting on beam expanders—enabling one engine to serve multiple large-aperture setups.
• Enhancing Infrared Measurement with MWIR/LWIR Transmission Grating Systems: Deploying dual-aperture configurations and cost-effective divergers versus traditional transmission spheres to improve signal-to-noise ratio.
• Expanding Versatility for Surface Roughness: Applying vibration-immune technologies and adaptable mounting solutions for large optics while maintaining precision for smaller components.
• Advancing Defect and Roughness Analysis: Using portable systems that operate standalone today and are future-ready for robotic integration as automation needs grow.

By prioritizing flexibility in design and deployment, organizations can ensure their metrology infrastructure supports both current demands and future growth trajectories.

About the presenter
Erik Novak, Ph.D., is vice president and general manager at 4D Technology, where he has worked since 2013. He has been developing instrumentation for precision metrology for more than 25 years in applications such as semiconductors, optics, astronomy, aerospace, automotive, photovoltaics, and medical devices. Novak has received seven international product awards, holds more than a dozen patents, and has more than 60 publications and book chapters related to surface measurement and industrial process control.