Photonics Spectra Optical Metrology Summit 2026

Join us LIVE on Wednesday April 22nd!

To attend presentations once the event begins:

Make sure you are logged in. If you are logged in, your name will appear on the badge in the top right corner of the website. Otherwise, click on the badge to log in.

Ask questions! Each presentation page features a text box for questions and comments. Presenters may reply during the summit, or afterwards via email.

Connect with suppliers. Between presentations, be sure to visit the Sponsors page to see product and service offerings. Click on a logo to see details about a company and send an inquiry!

For more information, visit our Help/FAQ page or contact Jacob.Mendel@photonics.com.

About this event
The publishers of Photonics Spectra invite you to the Optical Metrology Summit, a virtual event taking place on April 22, 2026 that will explore emerging trends and strategies shaping the next generation of optical metrology and high-performance imaging systems.

Attendees will hear from industry experts at 4D Technology, Optikos, Brookhaven National Laboratory, TRIOPTICS, Optical Metrology Solutions, and ZYGO, with a focus on surface- and system-level metrology. Sessions will highlight centration and phase-shift analysis, noise reduction in 3D measurements, and detection of stray light artifacts in imaging systems.

In addition to providing deeper insights into optical metrology, this summit offers registrants the opportunity to ask presenters questions via live chat and to connect with others in the field.

Registration to attend the event is FREE.