Reducing Noise in 3D Optical Surface Metrology

Measurement noise is not just a nuisance — it limits the reliability of your metrology. Especially when measuring optics or high-precision components, even a few picometers of uncertainty can undermine your results. Learn how to reduce measurement noise when using 3D optical profilers for surface metrology in this presentation from Leavy, an optical profiler product manager at Zygo.

Viewers will leave with an understanding of the true definition and importance of measuring noise in surface topography, key standards and terminology, distinguishing between instrument noise and measurement noise, and practical strategies for quantifying and reducing this noise.

About the presenter
Sean Leavy is the product manager of 3D optical profilers at Zygo. He is responsible for product strategy and roadmap alignment with customer needs and market demands. Leavy is a retired Army infantry captain and previously held positions in project management and operations at Emerson and Thermofisher.