Measurement time is precious, so it is critical to capture as much information as possible in one experimental run. The goal of this talk is to provide you with insights into how modern lock-in amplifier technology can help you to make the most out of each experiment you perform.
Claudius Riek will explain how to do so independently of whether you need to record one parameter or multiple variables simultaneously. He will start by summarizing how to implement lock-in detection to obtain maximum SNR. He will then discuss the advantages of direct AM/FM demodulation, as opposed to tandem demodulation, to recover more information from a measurement. To conclude, Riek will illustrate how a boxcar averager can capture even more information from a periodic non-sinusoidal signal within a given measurement time window.
About the presenter
Claudius Riek, Ph.D., is an application scientist responsible for all photonics applications at Zurich Instruments, with seven years of experience in ultrafast photonics, in particular THz time-domain spectroscopy, laser scanning microscopy, and frequency combs. Claudius is curious to look into new applications way beyond optics and photonics.