Tightening specifications and increased demand for high -performance optical coatings continue to drive advancements in many areas of the optical manufacturing industry. To ensure customer confidence, test and verification methods must be created to measure tighter tolerances than ever before for all aspects of thin-film quality control. Sittig outlines emerging performance requirements for optical thin films and the metrology solutions being developed to satisfy them.
About the presenter
For the last two years, Jared Sittig has worked in the Optical Thin-Film Coatings Department at Optimax, a high-precision optics manufacturer, located in Ontario, N.Y. He recently took on the role of optical coating metrology engineering group lead.
Currently, Sittig is involved with several engineering efforts within Optimax to support the development of technologies related to the characterization of optical thin films, including defect inspection, laser damage threshold testing, high-dynamic-range spectrophotometry, and photothermal common-path interferometry.
His background is in physics, and he graduated with a bachelor’s degree in physics and religion and philosophy from Roberts Wesleyan College (now Roberts Wesleyan University) in Rochester, NY.