Optimizing Micromachining Processes via Pulse-to-Pulse Measurement of Ultrafast Lasers
Optimizing Micromachining Processes via Pulse-to-Pulse Measurement of Ultrafast Lasers
Presented by:
Sergio Pellegrino, LaserPointSensors based on the laser-induced transverse voltage (LITV) effect offer several advantages over pyroelectric sensors and photodiodes when measuring laser energy. They feature fast sub-nanosecond response times and the ability to measure pulse durations from the femtosecond to microsecond range, and they do so with repetition frequencies beyond 1 MHz. LITV sensors also have a high saturation threshold to direct laser irradiation, as well as broadband spectral sensitivity from the UV to mid-IR range.
Pellegrino focuses on using LITV sensors to quantify two key laser characteristics of fast- and ultrafast-pulsed lasers: turn-on transient effects and missing-pulse detection. He further discusses the practical application of this methodology to ensure that individual laser pulses fall within the thresholds for optimal output during laser micromachining processes.
About the presenter
Sergio Pellegrino is a partner and an R&D director at LaserPoint, which manufactures a wide portfolio of laser power and energy meters. Before joining LaserPoint in 1997, Pellegrino worked as a group manager at Alcatel Alsthom Recherche in Paris, developing high-power diode devices and amplifiers. He also spent time as a project manager of optoelectric activities in the CDOT Alcatel Lucent Research Center, and as a team leader in the Department of Physical Electronics at Tokyo Institute of Technology.
About the sponsor(s)- LaserPoint srl - LaserPoint manufactures laser power and energy meters for laser measurements with high accuracy up to multi-kilowatts optical power level. We also provide unique in the market and patented high-tech solutions to measure ultrafast lasers down to femtosecond pulse duration and high repetition rates up to MHz range.
- DataRay Inc. - Founded in 1988, DataRay Inc. is a worldwide leader in laser beam profiling and analysis, delivering high-quality, affordable, and reliable instrumentation to the photonics industry. Product lines include beam profiling cameras (190 nm to 16 microns, model-dependent), and scanning slit beam profilers (190 nm to 4 microns, model dependent).
<>
Search for more products and services
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy. By using this website, you agree to the use of
cookies unless you have disabled them.