January 9 - 12, 2023 Online. FREE Registration.
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Photonic Integrated Circuits
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11
January
Test & Measurement
10:55 AM EST
Beginning Steps and Best Practices for Measuring Laser Beam Parameters
Ahmed Rihane (Gentec-EO)
11:30 AM EST
Optimizing Micromachining Processes via Pulse-to-Pulse Measurement of Ultrafast Lasers
Sergio Pellegrino (LaserPoint)
12:05 PM EST
Developments in Optical Coating Metrology Technology
Jared Sittig (Optimax)
12:40 PM EST
Rethinking Scratch-and-Dig Specifications
Dave Aikens (Savvy Optics)
1:15 PM EST
Metrology for Polarization Optics
Tom Baur (Meadowlark Optics)
1:50 PM EST
The Technology-Enabling Power of Dynamic Interferometry
Erik Novak (Onto Innovation)
2:25 PM EST
Minimizing Interferometric Measurement Variations During Optical Manufacturing
Robert Smythe (Äpre Instruments)
3:00 PM EST
Benefits and Limitations of Hand-Held Digital Light Processing Spectrophotometers
Rez Mani (Allied Scientific Pro)
3:35 PM EST
How to Boost Your Objective Lens Assembly with State-of-the-Art Alignment Technology
Christian Buss (TRIOPTICS), Patrik Langehanenberg (TRIOPTICS)
4:10 PM EST
How PIC Testing Is Evolving to Meet Rapidly Advancing Applications
Iñigo Artundo (VLC Photonics)
4:45 PM EST
Laser Measurement Accuracy: Why, When, and How
Mark Slutzki (MKS Ophir)
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