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The Technology-Enabling Power of Dynamic Interferometry

Presentation will begin: Wednesday, January 11, 2023 - 1:50 PM EST
Presented by: Erik Novak, Onto Innovation

Surface and wavefront measurements demand increasingly accurate precision and accuracy as specifications tighten on high-performance components. This is true even when production or test environments are challenging, be that due to testing in vacuum or cryogenic chambers, in the presence of turbulence, on a shop floor near machining centers, or in situ on aircraft or in automotive production lines. Capturing 3D surface height data via a single camera frame allows high-resolution results despite the overall environment in which the test piece is situated. Tradeoffs still exist between parameters such as exposure time, depth of field, lateral and vertical resolution and field of view. Fortunately, all of these parameters can be adjusted for optimal results.

Novak illustrates methods for highly precise, yet extremely rapid, measurements of surfaces and wavefront properties based on dynamic interferometry using polarization and specially pixelated cameras. He will discuss various optical configuration and for which applications they are best suited including specific examples:
  • Measuring surface shape, wavefront, and roughness on the shop floor and in extreme environments.
  • Measuring dynamically changing test surfaces.
  • Capturing 3D measurements with hand-held tools currently transforming manufacturing and inspection applications.
  • How robotics and automation are transforming measurement of large and complex parts including in aviation and optics manufacturing.


About the presenter
Erik Novak




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