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PROMOTEDChromasens GmbH Presentation
Speaker TBA (Chromasens)Deep Learning, AI, & Inspection
AI-Enabled Machine Vision: A Game-Changer for Inspection and Robotic Guidance Applications
Harley Green (Soft Robotics Inc.)
AI: From Buzzword to Practical
Eric Hershberger (Cognex)
Enhancing Inspection Systems: Maximizing Efficiency through Multi-Sensor Integration
Albert Tu (Hamamatsu Corporation)
Improve Inspection Process Using Large Vision Models in Medical Devices and Pharmaceutical
David Golembiewski (Landing AI), Ian Rysdale (Landing AI)
The Advantages of GigE Vision Connectivity for Embedded Vision
James Falconer (Pleora)
Tips and Traps in Deep Learning Data HandlingTips and Traps in Deep Learning Data Handling
Jan Gärtner (MVTec Software GmbH)3D Imaging
Unlocking the Unseen: Enhancing Machine Vision Capabilities with Polarization Information
Lars Johnsson (Metalenz)Camera, Systems, and Sensors
PROMOTEDPerformance Cameras, Software, and Systems for AI and Machine Learning Applications
John Ilett (Emergent Vision Technologies)
A Primer on Hybrid Event-Based Image Vision
Daisuke Saito (OMNIVISION)
HDR Imaging for Automotive Sensing: Technologies and Best Practices for High Dynamic Range Imaging and Tone Mapping
Alexis Teissie (LUCID Vision Labs)
The Evolvement of Line Scan Cameras and Their Increasing Impact on Mainstream Applications
Mihály Baki (JAI)Hyperspectral and SWIR Imaging
Broadband Imaging Using Quantum Dot Technology and Push Broom Sensor Development
Samiul Haque (Emberion)
Capturing the Full Spectrum with Simultaneous Multi-Camera Acquisition
George Killian (Headwall Photonics)
Maximizing Your Hyperspectral SWIR Imaging System with Optimized Illumination
Matthew Branch (ProPhotonix Ltd)
Snapshot Video Rate Hyperspectral Imaging for Computer Vision Applications
Daniel Pearce (Living Optics)
The Importance of Signal to Noise in SWIR Hyperspectral Imaging
Martin H. Ettenberg (Princeton infrared Technologies)
Tiny Dots Solving Big Problems: The Evolution and Future of CQD SWIR Technology
Sam Wyman (SWIR Vision Systems)Optics, Filters, and Illumination
Beyond the Numbers: Understanding Lens Specifications and Making an Educated Decision
Magnus Greger (Schneider-Kreuznach Group)
Contrast, Repeatability, and Protection: The Integral Role of Optical Filters in Machine Vision Systems
Georgy Das (Midwest Optical Systems)
Dynamic Machine Vision Camera Simulation in Operative Condition
Mina Nazari (Ansys)
Eliminating Distortion in Machine Vision Applications
Mark Peterson (Theia Technologies)
Importance of Numerical Aperture for Microscopy and Imaging
Nick Sischka (Edmund Optics)
Novel Lighting for Today’s High-Speed Machine Vision Challenges
Steve Kinney (Smart Vision Lights)
Optimizing Lens Selection for Hyperspectral and Multispectral Imaging: Key Considerations
Ethan Ide (Kowa American Corporation)
Uniform Top Hat Oblique Illumination for Machine Vision Applications
Ronian Siew (Venture Biotech Modules Business)
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